Design for Cold Test Elimination - Facing the Inverse Temperature Dependance (ITD) Challenge

Historically, circuits that operate in a high-temperature region could cause an increase in the total delay (td) especially in the process technology prior to the 90nm node. This was because both interconnects and transistors were slowing down as the temperature rose. However, for transistors with t...

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Bibliographic Details
Main Authors: Latif, Mohd Azman Abdul, Zain Ali, Noohul Basheer, Hussin, Fawnizu Azmadi
Format: Conference or Workshop Item
Published: 2012
Online Access:http://eprints.utp.edu.my/11991/1/06271971.pdf
http://eprints.utp.edu.my/11991/
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