Enhancement in IEEE 1500 Standard for at-speed Test and Debug
IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores...
Saved in:
| Main Authors: | , , , , |
|---|---|
| Format: | Conference or Workshop Item |
| Published: |
2014
|
| Online Access: | http://eprints.utp.edu.my/11970/1/06965327.pdf http://eprints.utp.edu.my/11970/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|