Multivoltage Aware Resistive Open Fault Model
Resistive open faults (ROFs) represent common interconnect manufacturing defects in VLSI designs causing delay failures and reliability-related concerns. The widespread utilization of multiple supply voltages in contemporary VLSI designs and emerging test methods poses a critical concern as to wheth...
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| Main Authors: | , , , |
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| Format: | Article |
| Published: |
IEEE
2014
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| Online Access: | http://eprints.utp.edu.my/11943/1/06472103.pdf http://eprints.utp.edu.my/11943/ |
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