Detectability Analysis for Resistive Open Faults with Dynamic Supply Voltage Scaling Awareness

• Main Authors: Mohammadat, Mohamed Tag Elsir, Zain Ali, Noohul Basheer, Hussin, Fawnizu Azmadi
• Format: Conference or Workshop Item
• Published: 2011
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utp.edu.my/6346/1/3C.1-102.pdf%3Fattachauth%3DANoY7crCFVBcEdkCSnbt8oV4oPGne7pnUMiKaNhOXiOiUFesSNa6kVwP_UKrwx3oJVgEMki13eRpyqMseo4_f-zA6QPggoNTQAO-xQZ2iieNU2ndjFeZI9hJSpVzZTXMktySJUdeKaSikE-Fh1JK63oLTnpOQ1aSu44HZmOdo6fK9qK8hPda3h6qGKQWtl4ggTpdCBgL8jM5%26attredirects%3D0; http://eprints.utp.edu.my/6346/

Dynamic supply voltage scaling (DVS) is an efficient and practical design technique to reduce power consumption in VLSI devices. Due to the multiple voltage operating environment and the supply voltage dependent behavior of physical faults, obtaining a minimal test set which gives the best fault cov...