NBTI-induced 8-Bit DAC circuit mismatch in System-On-Chip (SoC)

• Main Authors: Abdul Latif, Mohd Azman, Zain Ali, Noohul Basheer, Hussin, Fawnizu Azmadi
• Format: Conference or Workshop Item
• Published: 2011
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utp.edu.my/6344/1/1B.2-027.pdf; http://eprints.utp.edu.my/6344/

This paper focuses on Negative Bias Temperature Instability (NBTI) awareness to the circuit designer for reliable design of the System-On-a-Chip (SoC) analog circuit. The reliability performance of all matched pair such as current source and differential pair circuits, such as Bandgap Reference, is...