Design for Cold Test Elimination - Facing the Inverse Temperature Dependance (ITD) Challenge
Historically, circuits that operate in a high-temperature region could cause an increase in the total delay (td) especially in the process technology prior to the 90nm node. This was because both interconnects and transistors were slowing down as the temperature rose. However, for transistors with t...
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| Main Authors: | , , |
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| Format: | Conference or Workshop Item |
| Published: |
2012
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| Online Access: | http://eprints.utp.edu.my/11991/1/06271971.pdf http://eprints.utp.edu.my/11991/ |
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