Enhancement in IEEE 1500 Standard for At-Speed Functional Testing
System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a wid...
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| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2014
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| Online Access: | http://eprints.utp.edu.my/11966/1/06869507.pdf http://eprints.utp.edu.my/11966/ |
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