Propagation of delay faults caused by resistive open faults with dynamic voltage scaling awareness
Fault Diagnosis is important step in detecting manufacturing process problems and improving its quality. Characterizing the effect of faults on the performance of circuits is essential in diagnosing and testing faulty chips. Resistive opens are common manufacturing faults which affect the timing per...
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| Main Authors: | , , |
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| Format: | Conference or Workshop Item |
| Published: |
2011
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| Online Access: | http://eprints.utp.edu.my/11995/1/06136430.pdf http://eprints.utp.edu.my/11995/ |
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