Numerical analysis of vertical double gate mosfets (VDGM) with dielectric pocket (DP) effects on silicon pillar for nanoscale transistor
Numerical analysis of vertical double-gate MOSFETs (VDGM) that incorporates dielectric-pocket (DP) is addressed in this paper for the suppression of short-channel effects (SCE) and bulk punch-through. The comparison between standard and VDGM-DP revealed the advantages of DP for inhibition of SCE. Th...
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Main Authors: | Saad, Ismail, Lee, Razak M. A., Munawar, A. R., Ahmadi, M. Taghi, Ismail, Razali |
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Format: | Book Section |
Published: |
American Institute of Physics
2009
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Online Access: | http://eprints.utm.my/id/eprint/13017/ http://dx.doi.org/10.1063/1.3160269 |
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