Fault Analysis And Test For Bridge Defect In Resistive Random Access Memory
Resistive Random-Access Memory (ReRAM) is one of the potential candidates of emerging semiconductor memory to replace the conventional memory technologies.Besides, ReRAM offers many attractive advantages, such as non-volatile, scalable, low power consumption, and fast data access. Due to the infancy...
Saved in:
Main Author: | Arshad, Norsuhaidah |
---|---|
Format: | Thesis |
Language: | English English |
Published: |
2016
|
Subjects: | |
Online Access: | http://eprints.utem.edu.my/id/eprint/18373/1/Fault%20Analysis%20And%20Test%20For%20Bridge%20Defect%20In%20Resistive%20Random%20Access%20Memory.pdf http://eprints.utem.edu.my/id/eprint/18373/2/Fault%20Analysis%20And%20Test%20For%20Bridge%20Defect%20In%20Resistive%20Random%20Access%20Memory.pdf http://eprints.utem.edu.my/id/eprint/18373/ https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=100175 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
A New Test Scheme for Process Variation-Induced Faults in Resistive RAMs
by: Haron, Nor Zaidi, et al.
Published: (2013) -
Optimization of Resistance Load in 4T-Static Random-Access Memory Cell Based on Silicon Nanowire Transistor
by: Hashim, Yasir
Published: (2018) -
ZnO-Based Resistive Random Access Memory with Ti Interfacial Layer for Low Power Application
by: Isyaku, Usman Bature
Published: (2024) -
On Defect Oriented Testing for Hybrid CMOS/memristor Memory
by: Haron, Nor Zaidi, et al.
Published: (2011) -
On Defect Oriented Testing for Hybrid CMOS/memristor Memory
by: Haron, Nor Zaidi, et al.
Published: (2011)