Detecting Resistive-Opens in RRAM using Programmable DfT Scheme
Resistive Random Access Memory (RRAM) is one of the emerging memory devices that possesses a combined attribute of SRAM, DRAM and flash. How- ever, as the technology and fabrication process of such a promising memory devices are still immature, RRAM is expected to be impacted by process-variati...
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| Main Authors: | , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2013
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| Subjects: | |
| Online Access: | http://eprints.utem.edu.my/id/eprint/10106/1/ASQED13.pdf http://eprints.utem.edu.my/id/eprint/10106/ |
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