On Defect Oriented Testing for Hybrid CMOS/memristor Memory

• Main Authors: Haron, Nor Zaidi, Hamdioui, Said
• Format: Conference or Workshop Item
• Language: English
• Published: 2011
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utem.edu.my/id/eprint/4529/1/NZBHaron_ATS11.pdf; http://eprints.utem.edu.my/id/eprint/4529/

Hybrid CMOS/memristor memory (hybrid memory) technology is one of the emerging memory technologies potentially to replace conventional non-volatile flash memory. Existing research on such novel circuits focuses mainly on the integration between CMOS and non-CMOS, fabrication techniques and reliabili...