A fault syndromes simulator for random access memories
Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algo...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English English |
| Published: |
EuroJournals
2008
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| Online Access: | http://psasir.upm.edu.my/id/eprint/12689/1/A%20fault%20syndromes%20simulator%20for%20random%20access%20memories.pdf http://psasir.upm.edu.my/id/eprint/12689/ |
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