Optimization of process parameter variations on threshold voltage in Ultrathin Pillar Vertical Double Gate MOSFET Device
In the fabrication of MOSFET devices, the process parameters play a very important role in deciding the MOSFET device's characteristics. The process parameter variations may contribute a significant impact on the dopant profiles that directly affect the device characteristics. These variations...
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Main Authors: | Kaharudin K.E., Hamidon A.H., Salehuddin F., Ifwat Abd Aziz M.N., Ahmad I. |
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Other Authors: | 56472706900 |
Format: | Article |
Published: |
Asian Research Publishing Network
2023
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