PREDICTIVE ANALYTICS OF JUNCTIONLESS DOUBLE GATE STRAINED MOSFET USING GENETIC ALGORITHM WITH DOE-BASED GREY RELATIONAL ANALYSIS
This paper explores the application of Genetic Algorithm (GA) incorporated with design of experiment (DoE) based on Grey Relational Analysis (GRA) in predicting the optimal design parameters of n-type Junctionless Double Gate Strained MOSFET (JLDGSM). The GRA is applied to predict the optimum level...
Saved in:
Main Authors: | , , , , , , |
---|---|
其他作者: | |
格式: | Article |
出版: |
Taylor's University
2024
|
主題: | |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|