A March 5n FSM-based memory built-in self-test (MBIST) architecture with diagnosis capabilities

MBIST is a standard mechanism to test memory arrays and potentially detect all of the faults that may be present inside the memory cells using an effective collection of algorithms. However, a massive number of memory cells wrapped by BIST logic can result in substantial overhead in wiring, gate are...

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Bibliographic Details
Main Authors: Ng, Kok Heng, Alias, Nurul Ezaila, Hamzah, Afiq, Tan, Michael Loong Peng, Sheikh, Usman Ullah, Abdul Wahab, Yasmin
Format: Conference or Workshop Item
Published: 2022
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Online Access:http://eprints.utm.my/id/eprint/98690/
http://dx.doi.org/10.1109/ICSE56004.2022.9863160
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