A March 5n FSM-based memory built-in self-test (MBIST) architecture with diagnosis capabilities

• Main Authors: Ng, Kok Heng, Alias, Nurul Ezaila, Hamzah, Afiq, Tan, Michael Loong Peng, Sheikh, Usman Ullah, Abdul Wahab, Yasmin
• Format: Conference or Workshop Item
• Published: 2022
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/98690/; http://dx.doi.org/10.1109/ICSE56004.2022.9863160

MBIST is a standard mechanism to test memory arrays and potentially detect all of the faults that may be present inside the memory cells using an effective collection of algorithms. However, a massive number of memory cells wrapped by BIST logic can result in substantial overhead in wiring, gate are...