An efficient march (5n) FSM-based Memory Built-In Self Test (MBIST) architecture

• Main Authors: Nguan Kong, T. S., Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Peng Tan, M.L., Sheikh, U. Ullah, Abdul Wahab, Yasmin
• Format: Conference or Workshop Item
• Published: 2021
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.um.edu.my/35448/; https://www.scopus.com/inward/record.uri?eid=2-s2.0-85115112588&doi=10.1109%2fRSM52397.2021.9511602&partnerID=40&md5=2d0dce5b5081bf980b4e74a353449d1a

Embedded memory is the most common circuitry in all System on Chip (SoC). It is also a critical circuit that is difficult to be tested effectively and efficiently by using external testing equipment, therefore the testing cost is expensive. Memory Built-in Self Test (MBIST) which is a self-test circ...