Comprehensive study on random access memory testing : from test pattern generation algorithm to MBIST implementation
Semiconductor memory is one the most important microelectronic components in digital system design. Embedded memories have used up more than 20 percent of the silicon fabricated area in most of the consumer products. This revolution is calling for ever-increasing trend to reduce Defect Per Million (...
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| Format: | Thesis |
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2010
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| Online Access: | http://eprints.utm.my/id/eprint/26454/ http://libraryopac.utm.my/client/en_AU/main/search/results?qu=Comprehensive+study+on+random+access+memory+testing+%3A+from+test+pattern+generation+algorithm+to+MBIST+implementation&te= |
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