Electron microscopy analysis of microstructure of postannealed aluminum nitride template
The microstructure of an AlN template after high-temperature annealing was investigated by transmission electron microscopy (TEM). The AlN template was prepared by depositing an AlN layer of about 200nm thickness on a sapphire (0001) substrate by metal-organic vapor phase epitaxy. The AlN template w...
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Main Authors: | Kaur, J., Kuwano, N., Jamaludin, K. R., Mitsuhara, M., Saito, H., Hata, S., Suzuki, S., Miyake, H., Hiramatsu, K., Fukuyama, H. |
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Format: | Article |
Published: |
Japan Society of Applied Physics
2016
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Online Access: | http://eprints.utm.my/id/eprint/71617/ https://www.scopus.com/inward/record.uri?eid=2-s2.0-84973454810&doi=10.7567%2fAPEX.9.065502&partnerID=40&md5=56c20b61c46154e7ae2e411768a0a731 |
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