Modeling of temperature variations in MOSFET mismatch for circuit simulations

• Main Authors: Ismail, Muhamad Amri, Md. Nasir, Iskhandar, Ismail, Razali
• Format: Book Section
• Published: Institute of Electrical and Electronics Engineers 2009
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/12975/; http://dx.doi.org/10.1109/ASQED.2009.5206238

Temperature effect is one of the critical factors in manufacturing variability which could affect the designed circuit. This paper presents a MOSFET mismatch model with the consideration of temperature variations using physical based SPICE model parameters. The model development includes the mismatc...