Reliability assessment and mechanical characterization of Cu and Au ball bonds in BGA package
Link to publisher's homepage at http://link.springer.com/
Saved in:
Main Authors: | Chong, Leong Gan, Uda |
---|---|
Other Authors: | chong-leong.gan@spansion.com |
Format: | Article |
Language: | English |
Published: |
Springer Science+Business Media New York
2014
|
Subjects: | |
Online Access: | http://dspace.unimap.edu.my:80/dspace/handle/123456789/33099 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Superior performance and reliability of copper wire ball bonding in laminate substrate based ball grid array
by: Chong, Leong Gan, et al.
Published: (2014) -
Reliability assessment and activation energy study of au and pd-coated cu wires post high temperature aging in nanoscale semiconductor packaging
by: Chong, Leong Gan, et al.
Published: (2014) -
Solder ball robustness study on polymer core solder balls for BGA packages
by: Kar Y.B., et al.
Published: (2023) -
Influence of shear strength on long term biased humidity reliability of Cu ball bonds
by: Chong, Leong Gan, et al.
Published: (2015) -
Extended reliability of gold and copper ball bonds in microelectronic packaging
by: Chong, Leong Gan, et al.
Published: (2014)