Extended reliability of gold and copper ball bonds in microelectronic packaging
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Main Authors: | Chong, Leong Gan, Classe, Francis, Bak, Lee Chan, Uda, Hashim, Prof. Dr. |
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Other Authors: | chong-leong.gan@spansion.com |
Format: | Article |
Language: | English |
Published: |
World Gold Council
2014
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Subjects: | |
Online Access: | http://dspace.unimap.edu.my:80/dspace/handle/123456789/33097 |
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