Study of acceleratin voltage influence the Conical structure during Electron Beam Induced Deposition (EBID)
Access is limited to UniMAP community.
Saved in:
Main Author: | Muhammad Afif Abdul Rahman |
---|---|
Other Authors: | Shaiful Nizam Mohyar (Advisor) |
Format: | Learning Object |
Language: | English |
Published: |
Universiti Malaysia Perlis
2008
|
Subjects: | |
Online Access: | http://dspace.unimap.edu.my/xmlui/handle/123456789/1984 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Study of Deposition Time Influence the Conical Structure during Electron Beam Induced Deposition (EBID)
by: Mohamad Sharizal Md Ilias
Published: (2008) -
Analysis of square shaped Microstructure based Electron Beam induced deposition
by: Siti Fatimah Abd. Rahman
Published: (2008) -
The influence of the accelerating voltages on the growth of the square structure during Electron Beam Induced Deposition (EBID) method
by: Muhammad Afiq Abdul Aziz
Published: (2008) -
Analysis of the deposited carbon during Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope using Secondary Ion Mass Spectrometry (SIMS)
by: Nur Liana Kamal
Published: (2008) -
Microelectronic Fabrication
by: Universiti Malaysia Perlis (UniMAP)
Published: (2017)