Description: Study of acceleratin voltage influence the Conical structure during Electron Beam Induced Deposition (EBID)

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Bibliographic Details
Main Author:	Muhammad Afif Abdul Rahman
Other Authors:	Shaiful Nizam Mohyar (Advisor)
Format:	Learning Object
Language:	English
Published:	Universiti Malaysia Perlis 2008
Subjects:	Electron beams Scanning electron microscopes Silicon Microelectronics Microelectronic fabrication
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/1984
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Summary:	Access is limited to UniMAP community.