Impact of interface traps and parasitic capacitance on gate capacitance of In0.53Ga0.47As-FinFET for sub 14nm technology node
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Main Authors: | Pathak, Jay, Darji, Anand |
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Other Authors: | jaypathak050@gmail.com |
Format: | Article |
Language: | English |
Published: |
Universiti Malaysia Perlis (UniMAP)
2019
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Subjects: | |
Online Access: | http://dspace.unimap.edu.my:80/xmlui/handle/123456789/61121 |
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