Impact of interface traps and parasitic capacitance on gate capacitance of In0.53Ga0.47As-FinFET for sub 14nm technology node

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Main Authors: Pathak, Jay, Darji, Anand
其他作者: jaypathak050@gmail.com
格式: Article
语言:English
出版: Universiti Malaysia Perlis (UniMAP) 2019
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在线阅读:http://dspace.unimap.edu.my:80/xmlui/handle/123456789/61121
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