Impact of interface traps and parasitic capacitance on gate capacitance of In0.53Ga0.47As-FinFET for sub 14nm technology node

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Bibliographic Details
Main Authors: Pathak, Jay, Darji, Anand
Other Authors: jaypathak050@gmail.com
Format: Article
Language:English
Published: Universiti Malaysia Perlis (UniMAP) 2019
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Online Access:http://dspace.unimap.edu.my:80/xmlui/handle/123456789/61121
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