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A framework to study time-dependent variability in circuits at sub-35nm technology nodes

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Bibliographic Details
Main Authors:	Tang, Tong Boon, Murray, Alan F, Cheng, Binjie, Asenov, Asen
Format:	Conference or Workshop Item
Published:	2012
Online Access:	http://scholars.utp.edu.my/id/eprint/36589/
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