Cover Image

A framework to study time-dependent variability in circuits at sub-35nm technology nodes

Saved in:
Bibliographic Details
Main Authors: Tang, Tong Boon, Murray, Alan F, Cheng, Binjie, Asenov, Asen
Format: Conference or Workshop Item
Published: 2012
Online Access:http://scholars.utp.edu.my/id/eprint/36589/
Tags: Add Tag
No Tags, Be the first to tag this record!
id oai:scholars.utp.edu.my:36589
record_format eprints
spelling oai:scholars.utp.edu.my:365892023-06-19T04:18:54Z http://scholars.utp.edu.my/id/eprint/36589/ A framework to study time-dependent variability in circuits at sub-35nm technology nodes Tang, Tong Boon Murray, Alan F Cheng, Binjie Asenov, Asen 2012 Conference or Workshop Item NonPeerReviewed Tang, Tong Boon and Murray, Alan F and Cheng, Binjie and Asenov, Asen (2012) A framework to study time-dependent variability in circuits at sub-35nm technology nodes. In: 2012 IEEE International Symposium on Circuits and Systems (ISCAS).
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
format Conference or Workshop Item
author Tang, Tong Boon
Murray, Alan F
Cheng, Binjie
Asenov, Asen
spellingShingle Tang, Tong Boon
Murray, Alan F
Cheng, Binjie
Asenov, Asen
A framework to study time-dependent variability in circuits at sub-35nm technology nodes
author_facet Tang, Tong Boon
Murray, Alan F
Cheng, Binjie
Asenov, Asen
author_sort Tang, Tong Boon
title A framework to study time-dependent variability in circuits at sub-35nm technology nodes
title_short A framework to study time-dependent variability in circuits at sub-35nm technology nodes
title_full A framework to study time-dependent variability in circuits at sub-35nm technology nodes
title_fullStr A framework to study time-dependent variability in circuits at sub-35nm technology nodes
title_full_unstemmed A framework to study time-dependent variability in circuits at sub-35nm technology nodes
title_sort framework to study time-dependent variability in circuits at sub-35nm technology nodes
publishDate 2012
url http://scholars.utp.edu.my/id/eprint/36589/
_version_ 1769845527898226688
score 13.160551

Similar Items