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Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

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Bibliographic Details
Main Authors:	Kou, Lili, Ma, Zongmin, Li, Yan Jun, Naitoh, Yoshitaka, Komiyama, Masaharu, Sugawara, Yasuhiro
Format:	Article
Published:	IOP Publishing 2015
Online Access:	http://scholars.utp.edu.my/id/eprint/35493/
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