A new scanning method for fast atomic force microscopy
In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology research. It was first conceived to generate 3-D images of conducting as well as nonconducting surfaces with a high degree of accuracy. Presently, it is also being used in applications that involve mani...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers ( IEEE )
2011
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/559/1/A_new_scanning_method_for_fast_atomic_force_microscopy.pdf http://irep.iium.edu.my/559/ http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7729 |
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