A novel intelligent based controller for fast atomic force microscopy
Piezoelectric tube scanner is a major component that used in nanoscale imaging tools such as atomic force microscopy (AFM). This is because it can provide precise nanoscale positioning. However the precision is limited by vibration and some nonlinear drawbacks represented by hysteresis and creep. Hy...
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| Format: | Monograph |
| Language: | English |
| Published: |
IIUM Press
2015
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| Online Access: | http://irep.iium.edu.my/42747/1/RESEARCH_REPORT_-_EDW_B11-119-0597.pdf http://irep.iium.edu.my/42747/ |
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