Fast spiral-scan atomic force microscopy
In this paper, we describe a new scanning technique for fast atomic force microscopy. In this method, the sample is scanned in a spiral pattern instead of the well established raster pattern. AÂ spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying ampl...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2009
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/566/1/Fast_spiral-scan_atomic_force_microscopy.pdf http://irep.iium.edu.my/566/ http://stacks.iop.org/0957-4484/20/i=36/a=365503 |
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