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Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

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Main Authors: Kou, Lili, Ma, Zongmin, Li, Yan Jun, Naitoh, Yoshitaka, Komiyama, Masaharu, Sugawara, Yasuhiro
Format: Article
Published: IOP Publishing 2015
Online Access:http://scholars.utp.edu.my/id/eprint/35493/
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id oai:scholars.utp.edu.my:35493
record_format eprints
spelling oai:scholars.utp.edu.my:354932023-04-06T03:57:38Z http://scholars.utp.edu.my/id/eprint/35493/ Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback Kou, Lili Ma, Zongmin Li, Yan Jun Naitoh, Yoshitaka Komiyama, Masaharu Sugawara, Yasuhiro IOP Publishing 2015 Article NonPeerReviewed Kou, Lili and Ma, Zongmin and Li, Yan Jun and Naitoh, Yoshitaka and Komiyama, Masaharu and Sugawara, Yasuhiro (2015) Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback. Nanotechnology, 26 (19). p. 195701.
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
format Article
author Kou, Lili
Ma, Zongmin
Li, Yan Jun
Naitoh, Yoshitaka
Komiyama, Masaharu
Sugawara, Yasuhiro
spellingShingle Kou, Lili
Ma, Zongmin
Li, Yan Jun
Naitoh, Yoshitaka
Komiyama, Masaharu
Sugawara, Yasuhiro
Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback
author_facet Kou, Lili
Ma, Zongmin
Li, Yan Jun
Naitoh, Yoshitaka
Komiyama, Masaharu
Sugawara, Yasuhiro
author_sort Kou, Lili
title Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback
title_short Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback
title_full Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback
title_fullStr Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback
title_full_unstemmed Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback
title_sort surface potential imaging with atomic resolution by frequency-modulation kelvin probe force microscopy without bias voltage feedback
publisher IOP Publishing
publishDate 2015
url http://scholars.utp.edu.my/id/eprint/35493/
_version_ 1762840240243867648
score 13.214268

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