Development of Low-Cost Precision Scanner System for Scanning Probe Microscopy Application

• Main Author: Kang, Qin Yee
• Format: Final Year Project / Dissertation / Thesis
• Published: 2015
• Subjects: TA Engineering (General). Civil engineering (General); TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utar.edu.my/1796/1/Development_of_Low%2DCost_Precision_Scanner_System_for_Scanning_Probe_Microscopy_Application.pdf; http://eprints.utar.edu.my/1796/

Atomic Force Microscope (AFM), also known as “Scanning Force Microscopy (SFM)”. It is a microscope that can measure up to nanometer technology. In AFM, there is a pin, when this pin touches a bump and the pin will rise up. When the pin rise up, the laser that target to the pin and reflect to photodi...