Mechanism-based reliability model for electronic packages

Mechanism-based reliability model is different from the conventional reliability model. It is generated based on a specific failure. The failure mechanism is studied in detail to obtain a model that incorporates all significant stressing variables. For fatigue driven failure, Coffin-Manson equation...

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Bibliographic Details
Main Author: Ng, Chee Weng
Format: Thesis
Language:English
Published: 2005
Subjects:
Online Access:http://eprints.utm.my/id/eprint/4369/1/NgCheeWengMFKM2005.pdf
http://eprints.utm.my/id/eprint/4369/
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