TEM Studies of SPUTTER-DEPOSITED Ni4Al Alloy Thin Films
The nanostructural characteristics of direct-current magnetron sputter-deposited Ni4Al alloy films were studied during in situ isothermal annealing in a transmission electron microscope. An expansion of the lattice by nearly 5% was observed for the Ni0.8Al0.2 films in their low-thickness and as-depo...
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Main Author: | T., Joseph Sahaya Anand |
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Format: | Conference or Workshop Item |
Language: | English English |
Published: |
2011
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Subjects: | |
Online Access: | http://eprints.utem.edu.my/id/eprint/10147/1/SJC_Invited.pdf http://eprints.utem.edu.my/id/eprint/10147/2/SJC_Invited.pdf http://eprints.utem.edu.my/id/eprint/10147/ |
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