Thermal aging study at 150 °C and 200 °C: Gold ball bonds to aluminum bond pad

Link to publisher's homepage at http://www.electrochem.org/

Saved in:
Bibliographic Details
Main Authors: Mohd Khairuddin, Md Arshad, Lim, Moy Fung, Uda, Hashim, Zaliman, Sauli
Format: Article
Language:English
Published: The Electrochemical Society 2010
Subjects:
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/7463
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.unimap-7463
record_format dspace
spelling my.unimap-74632010-01-03T06:36:10Z Thermal aging study at 150 °C and 200 °C: Gold ball bonds to aluminum bond pad Mohd Khairuddin, Md Arshad Lim, Moy Fung Uda, Hashim Zaliman, Sauli Intermetallic growth Thermal aging Wire bonding Field emission Semiconductor materials Aluminum Light metals Link to publisher's homepage at http://www.electrochem.org/ This paper presents the study of the thermal aging of the gold ball bonds and aluminum bond pad at 150 °C and 200 °C for various interval times. Process decapsulation and Field Emission Scanning Electron Microscopy (FESEM) are used to reveal the intermetallic coverage and Kirkendall voiding. Energy Dispersive X-Ray (EDX) is then used to determine the intermetallic phase. The results shows that under thermal aging, the Kirkendall voids are seen, various intermetallic phases are detected and the intermetallic thickness increased tremendously at 200° C after 168 hrs as compared to 150 °C exposure times. 2010-01-03T06:36:10Z 2010-01-03T06:36:10Z 2009-03-17 Article p.633-640 http://www.electrochem.org/ http://hdl.handle.net/123456789/7463 en Proceedings of the 7th International Conference on Semiconductor Technology (ISTC 2008) The Electrochemical Society
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Intermetallic growth
Thermal aging
Wire bonding
Field emission
Semiconductor materials
Aluminum
Light metals
spellingShingle Intermetallic growth
Thermal aging
Wire bonding
Field emission
Semiconductor materials
Aluminum
Light metals
Mohd Khairuddin, Md Arshad
Lim, Moy Fung
Uda, Hashim
Zaliman, Sauli
Thermal aging study at 150 °C and 200 °C: Gold ball bonds to aluminum bond pad
description Link to publisher's homepage at http://www.electrochem.org/
format Article
author Mohd Khairuddin, Md Arshad
Lim, Moy Fung
Uda, Hashim
Zaliman, Sauli
author_facet Mohd Khairuddin, Md Arshad
Lim, Moy Fung
Uda, Hashim
Zaliman, Sauli
author_sort Mohd Khairuddin, Md Arshad
title Thermal aging study at 150 °C and 200 °C: Gold ball bonds to aluminum bond pad
title_short Thermal aging study at 150 °C and 200 °C: Gold ball bonds to aluminum bond pad
title_full Thermal aging study at 150 °C and 200 °C: Gold ball bonds to aluminum bond pad
title_fullStr Thermal aging study at 150 °C and 200 °C: Gold ball bonds to aluminum bond pad
title_full_unstemmed Thermal aging study at 150 °C and 200 °C: Gold ball bonds to aluminum bond pad
title_sort thermal aging study at 150 °c and 200 °c: gold ball bonds to aluminum bond pad
publisher The Electrochemical Society
publishDate 2010
url http://dspace.unimap.edu.my/xmlui/handle/123456789/7463
_version_ 1643788818095013888
score 13.211869