Scheduling Power-Constrained Tests through the SoC Functional Bus

• Main Authors: Hussin, Fawnizu Azmadi, Yoneda, Tomokazu, Orailoglu, Alex, Fujiwara, Hideo
• Format: Article
• Published: Institute of Electronics, Information and Communication Engineers, Japan (IEICE) 2008
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utp.edu.my/3594/1/fawnizu_ieice1-revised3.pdf; http://www.ieice.org/eng/books/trans.html; http://eprints.utp.edu.my/3594/

This paper proposes a test methodology for core-based testing of System-on-Chips by utilizing the functional bus as a test access mechanism. The functional bus is used as a transportation channel for the test stimuli and responses from a tester to the cores under test (CUT). To enable test concurren...