On Using IEEE 1500 Standard for Functional Testing

• Main Authors: Ali, Ghazanfar, Hussin, Fawnizu Azmadi, Zain Ali, Noohul Basheer, Hamid, Nor Hisham
• Format: Conference or Workshop Item
• Published: 2013
• Online Access: http://eprints.utp.edu.my/11979/1/06643561.pdf; http://eprints.utp.edu.my/11979/

In core based design (i.e. System on Chip) testing, IEEE 1500 standard has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in the functional mode. In this paper, a proposed method to enhanc...