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On Using IEEE 1500 Standard for Functional Testing

In core based design (i.e. System on Chip) testing, IEEE 1500 standard has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in the functional mode. In this paper, a proposed method to enhanc...

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Main Authors: Ali, Ghazanfar, Hussin, Fawnizu Azmadi, Zain Ali, Noohul Basheer, Hamid, Nor Hisham
Format: Conference or Workshop Item
Published: 2013
Online Access:http://eprints.utp.edu.my/11979/1/06643561.pdf
http://eprints.utp.edu.my/11979/
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spelling my.utp.eprints.119792017-01-19T08:21:07Z On Using IEEE 1500 Standard for Functional Testing Ali, Ghazanfar Hussin, Fawnizu Azmadi Zain Ali, Noohul Basheer Hamid, Nor Hisham In core based design (i.e. System on Chip) testing, IEEE 1500 standard has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in the functional mode. In this paper, a proposed method to enhance the IEEE 1500 standard for functional testing in order to increase observability during functional test is discussed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on SAYEH processor in order to test it using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the modification to the IEEE 1500 standard enables it to be used for functional testing, with increased observability. 2013 Conference or Workshop Item PeerReviewed application/pdf http://eprints.utp.edu.my/11979/1/06643561.pdf Ali, Ghazanfar and Hussin, Fawnizu Azmadi and Zain Ali, Noohul Basheer and Hamid, Nor Hisham (2013) On Using IEEE 1500 Standard for Functional Testing. In: 5th Asia Symposium on Quality Electronic Design (ASQED 2013), August 26 - 28, 2013, Penang, Malaysia. http://eprints.utp.edu.my/11979/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
description In core based design (i.e. System on Chip) testing, IEEE 1500 standard has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in the functional mode. In this paper, a proposed method to enhance the IEEE 1500 standard for functional testing in order to increase observability during functional test is discussed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on SAYEH processor in order to test it using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the modification to the IEEE 1500 standard enables it to be used for functional testing, with increased observability.
format Conference or Workshop Item
author Ali, Ghazanfar
Hussin, Fawnizu Azmadi
Zain Ali, Noohul Basheer
Hamid, Nor Hisham
spellingShingle Ali, Ghazanfar
Hussin, Fawnizu Azmadi
Zain Ali, Noohul Basheer
Hamid, Nor Hisham
On Using IEEE 1500 Standard for Functional Testing
author_facet Ali, Ghazanfar
Hussin, Fawnizu Azmadi
Zain Ali, Noohul Basheer
Hamid, Nor Hisham
author_sort Ali, Ghazanfar
title On Using IEEE 1500 Standard for Functional Testing
title_short On Using IEEE 1500 Standard for Functional Testing
title_full On Using IEEE 1500 Standard for Functional Testing
title_fullStr On Using IEEE 1500 Standard for Functional Testing
title_full_unstemmed On Using IEEE 1500 Standard for Functional Testing
title_sort on using ieee 1500 standard for functional testing
publishDate 2013
url http://eprints.utp.edu.my/11979/1/06643561.pdf
http://eprints.utp.edu.my/11979/
_version_ 1738655996480323584
score 13.222552

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