Enhancement in IEEE 1500 standard for at-speed functional testing

• Main Authors: Ali, G., Hussin, F.A., Ali, N.B.Z., Hamid, N.H.
• Format: Conference or Workshop Item
• Published: IEEE Computer Society 2014
• Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906330413&doi=10.1109%2fICIAS.2014.6869507&partnerID=40&md5=39e077f6adb39c7c458f2069ea8770df; http://eprints.utp.edu.my/32165/

System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a wid...