Enhancement in IEEE 1500 Standard for at-speed Test and Debug

• Main Authors: Ali, Ghazanfar, Hussin, Fawnizu Azmadi, Zain Ali, Noohul Basheer, Hamid, Nor Hisham, Adnan, Raja Mahmud
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://eprints.utp.edu.my/11970/1/06965327.pdf; http://eprints.utp.edu.my/11970/

IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability.