Enhancement in IEEE 1500 Standard for at-speed Test and Debug
IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores...
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| Main Authors: | , , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2014
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| Online Access: | http://eprints.utp.edu.my/11970/1/06965327.pdf http://eprints.utp.edu.my/11970/ |
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| Summary: | IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability. |
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