Electrical characterization of gold contact on porous silicon layers
Investigation on metallic contact on porous silicon (PS) layers is typically important before final integration into application devices. The electrical characterization of Au thickness of 100 nm and ∼210 nm on ∼3 μm and ∼6 μm PS thickness on PS were studied by measuring the current-voltage (I-V) re...
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Main Authors: | , |
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Format: | Conference or Workshop Item |
Language: | English |
Published: |
2017
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Online Access: | http://eprints.utm.my/id/eprint/97137/1/MasturaShafinazZainalAbidin2017_ElectricalCharacterizationofGoldContact.pdf http://eprints.utm.my/id/eprint/97137/ http://dx.doi.org/10.1109/RSM.2017.8069138 |
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