Description: Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: a review

Link to publisher's homepage at http://www.journals.elsevier.com

Saved in:

Bibliographic Details
Main Authors:	Louis, Gerrer, Ding, J., Amoroso, S. M., Adamu-Lema, F., R., Hussin, Reid, D., Millar, C., Asenov, A.
Other Authors:	louis.gerrer@glasgow.ac.uk
Format:	Article
Language:	English
Published:	Elsevier 2014
Subjects:	MOSFETs Statistical Variability (SV)
Online Access:	http://dspace.unimap.edu.my:80/dspace/handle/123456789/35523
Tags:	Add Tag No Tags, Be the first to tag this record!

Description
Summary:	Link to publisher's homepage at http://www.journals.elsevier.com