Comparative reliability studies and analysis of Au, Pd-coated Cu and Pd-doped Cu wire in microelectronics packaging
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| Main Authors: | , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
Public Library of Science
2014
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| Online Access: | http://dspace.unimap.edu.my:80/dspace/handle/123456789/34036 |
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