Analysis of NBTI effects on read and write operations of 6t SRAM cells

• Main Authors: Zahari, Hashimah, Hussin, Hanim, Muhamad, Maizan, Soin, Norhayati, Abdul Wahab, Yasmin
• Format: Article
• Published: Taylor's University 2022
• Subjects: Q Science (General)
• Online Access: http://eprints.um.edu.my/43927/

Negative Bias Temperature Instability (NBTI) is an important reliability issue in CMOS devices that affects the performance of CMOS-based circuits. Therefore, it is vital to comprehend the impact of different defect mechanisms and wide operating conditions about stress and recovery time on the circu...