Multiple and solid data background scheme for testing static single cell faults on SRAM memories

Memory testing is a method that requires an algorithm capable of detecting faulty memory as comprehensively as possible to facilitate the efficient manufacture of fault free memory products. Therefore, the purpose of this thesis is to introduce a Data Background (DB) scheme to generate an optimal...

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Bibliographic Details
Main Author: Zakaria, Nor Azura
Format: Thesis
Language:English
Published: 2013
Subjects:
Online Access:http://psasir.upm.edu.my/id/eprint/84183/1/FK%202013%20142%20-%20ir.pdf
http://psasir.upm.edu.my/id/eprint/84183/
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